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Verigy and Test Insight collaborate on test program

Verigy Ltd. and Test Insight, announced an enhanced and integrated ability to read and write test programs used with the Verigy V93000 SOC tester.

The new Verigy STIL Reader/Writer allows semiconductor manufacturers to improve their time-to-market by speeding the process for creating and debugging test programs. The STIL Reader/Writer is a result of Verigy's ongoing technology collaboration with Test Insight, a supplier of design to test software for digital integrated circuits (ICs).

"Building on Test Insight's tool technology, this new tool will help our customers in adopting STIL for accelerating their time-to-market," said Hans-Juergen Wagner, vice president and general manager, Semiconductor Test Solutions, Verigy.

"With this new and integrated capability, semiconductor manufacturers can take full advantage of the V93000 leading-edge platform technology in a standard-compliant tooling environment."

"Test Insight's extensive experience in providing design-for-test solutions, in conjunction with Verigy's tight cooperation, enabled us to provide this modular solution. Such modularity allows customers to select the pieces most suitable for their environment," said Meir Gellis, chief executive officer, Test Insight.

"The cooperation with Verigy gave us the opportunity to directly address customers' needs with a solution for bringing STIL test data to the tester and translating the results from the tester back to STIL."

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