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Monday 17th January 2022
Automatic defect review with atomic force microscopy visualizes defects in three dimensions with nanometer-resolution and therefore qualifies as ideal technique for the semiconductor industry where imaging nanoscale devices is an integral part of the manufacturing process.Detecting and classifying defects using automatic defect review with three-dimensional and non-invasive imaging via atomic force microscopy
Monday 7th June 2021
Author: Applied Energy Systems
Wednesday 7th October 2020
Kate Wilson, VP Marketing, Edwards Vacuum
Monday 1st July 2019
Tuesday 11th September 2018
Wednesday 5th July 2017
New controller modernised with colour touchscreen interface and EtherCAT PLC-based control system
Friday 2nd June 2017
Chinese partners deliver initial downpayment of €64.3 million

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