SiS Magazine
Newsletter date: Monday 3rd August 2020
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News Image Tower integrates RF phase change switches in SiGE process

Provides record Figure of Merit performance for 5G and high-performance RF switch applications

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News Image Sales to 300 mm wafer market boosts Picosun to new record in Q2/2020

Picosun Group, supplier of AGILE ALD® (Atomic Layer Deposition) thin film coating equipment and solutions, reports record sales during the second qua...

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Park Systems
Park NX-TSH Automated Tip Scanning Head with gantry style air-bearing stage meets the demand for Atomic Force Metrology for flat panel displays. Park NX-TSH overcomes nanometrology challenges for samples over 300mm. Get reliable, high resolution AFM images on your ultra large sample size OLEDs, LCDs, photomasks and more with Park NX-TSH.

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Park Systems
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News Image RENA diversifies with additive manufacturing

RENA acquires the Hirtenberger group’s successful Hirtisation segment

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News Image Atotech expands its software capabilities

Signs definitive agreement to acquire Visutech Plating

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News Image Onto Announces new material analysis tool

Element Fourier-transform infrared (FTIR) spectroscopy system targets dielectric monitoring of product wafers

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Adverter Media Pack
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News Image Semiconductor foundry joins RE100 and calls on peers to step up on renewable energy

One of Taiwan’s biggest companies, TSMC, is committing to source 100% renewable electricity globally as part of RE100, and urging peers across the e...

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News Image Park Systems Introduces New Automated AFM for Large Panel Displays

Park Systems has announced its new Park NX-TSH, an automated tip scan head atomic force microscope (AFM) for large sample analysis over 300mm. The Par...

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News Image EVG completes new clean room facility

Newly opened Cleanroom V building nearly doubles cleanroom capacity and strengthens capabilities of NILPhotonics and Heterogeneous Integration Competence Centres

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SiS Magazine
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