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Toshiba Boosts MOSFET With Al-strap Replacement For Wirebond

Toshiba has developed a family of power MOSFETS using its new “Ultra High Speed U-MOS III” (UHS U-MOS III) technology. The process represents the company’s first use of aluminum strap (Al-strap) connections to improve typical on-resistance (RDSon) by 34% at a Vgs of 4.5V and reduce gate charge (QSW) by 14% compared to U-MOS III with standard wire bond technology. The family of UHS U-MOS III with Al-strap MOSFETs is targeted for synchronous rectification applications in DC-to-DC converters and in power supplies for desktop and mobile computers, servers, networking and telecom equipment.
Toshiba has developed a family of power MOSFETS using its new “Ultra High Speed U-MOS III” (UHS U-MOS III) technology. The process represents the company's first use of aluminum strap (Al-strap) connections to improve typical on-resistance (RDSon) by 34% at a Vgs of 4.5V and reduce gate charge (QSW) by 14% compared to U-MOS III with standard wire bond technology. The family of UHS U-MOS III with Al-strap MOSFETs is targeted for synchronous rectification applications in DC-to-DC converters and in power supplies for desktop and mobile computers, servers, networking and telecom equipment.
The Al-strap is a proprietary bonding technique that conforms to a standard 8-pin (SOP-8) package. It incorporates aluminium connections - the “straps” - between the chip and the terminal in order to reduce the conduction resistance in the package compared with traditional bonding wires. Al-strap bonding is achieved via an ultra-sonic method instead of solder.
The fast switching UHS U-MOS III process was introduced at Toshiba in January 2003. The process uses a trench cell structure MOSFET.
Four Al-strap MOSFETs are available now in SPO8 packaging.


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