Keithley´s device, component, and circuit characterization solutions combine superior precision and accuracy with exceptional speed and ease of use. For semiconductor reliability testing, Keithley has integrated test solutions for wafer level reliability, accelerated stress, quality assurance, hot carrier degradation, time dependent dielectric breakdown and analysis, and many other general Test&Measurement and Data Acquisition applications, including:

· High Performance Single-insertion RF and DC Test Solution · Fast and easy to use single to multi-channel Device Characterization incl. KTE, HCI, IC-CAP software · C-V Measurements · Ethernet-based Switch/Measure systems, SourceMeters, DMMs, Data Acquisition products

Contact us for free application advice.

Use expert advice from Keithley's team of test experts. For more information about any of our solutions or to discuss your application with one of our experts, call or send a fax or an e-mail to your local Keithley office:

Belgium: phone 02-363 00 40, fax 02-362 00 64, e-mail info@keithley.nl Finland: phone 09-53 06 65 60, fax 09-53 06 65 65, e-mail finland@keithley.com France: phone 01-64 53 20 20, fax 01-60 11 77 26, e-mail info@keithley.fr Germany: phone 089-84 93 07-40, fax 089-84 93 07-34, e-mail info@keithley.de Italy: phone 02-48 39 16 01, fax 02-48 30 22 74, e-mail info@keithley.it The Netherlands: phone 0183-63 53 33, fax 0183-63 08 21, e-mail info@keithley.nl Sweden: phone 08-50 90 46 00, fax 08-50 90 46 00, e-mail sweden@keithley.com Switzerland: phone 01-821 94 44, fax 01-821 94 44, e-mail info@keithley.ch United Kingdom: phone 0118-929 75 00, fax 0118-929 75 19, e-mail info@keithley.co.uk USA: phone 440-248-0400, fax 440-248-6168, e-mail info@keithley.com India: 080-212 80-27/-28/-29, fax 089-212 80 05, e-mail support_india@keithley.com

For all countries not listed call the KIEX department in Germany: phone +49-89-84 93 07-0, fax +49-89-84 93 07-87, e-mail kiex_sales@keithley.com Internet: www.keithley.com

Keithley´s device, component, and circuit characterization solutions combine superior precision and accuracy with exceptional speed and ease of use. For semiconductor reliability testing, Keithley has integrated test solutions for wafer level reliability, accelerated stress, quality assurance, hot carrier degradation, time dependent dielectric breakdown and analysis, and many other general Test&Measurement and Data Acquisition applications, including:

· High Performance Single-insertion RF and DC Test Solution

· Fast and easy to use single to multi-channel Device Characterization incl. KTE, HCI, IC-CAP software

· C-V Measurements

· Ethernet-based Switch/Measure systems, SourceMeters, DMMs, Data Acquisition products

Contact us for free application advice.

Use expert advice from Keithley's team of test experts. For more information about any of our solutions or to discuss your application with one of our experts, call or send a fax or an e-mail to your local Keithley office:

Belgium: phone 02-363 00 40, fax 02-362 00 64, e-mail info@keithley.nl

Finland: phone 09-53 06 65 60, fax 09-53 06 65 65, e-mail finland@keithley.com

France: phone 01-64 53 20 20, fax 01-60 11 77 26, e-mail info@keithley.fr

Germany: phone 089-84 93 07-40, fax 089-84 93 07-34, e-mail info@keithley.de

Italy: phone 02-48 39 16 01, fax 02-48 30 22 74, e-mail info@keithley.it

The Netherlands: phone 0183-63 53 33, fax 0183-63 08 21, e-mail info@keithley.nl

Sweden: phone 08-50 90 46 00, fax 08-50 90 46 00, e-mail sweden@keithley.com

Switzerland: phone 01-821 94 44, fax 01-821 94 44, e-mail info@keithley.ch

United Kingdom: phone 0118-929 75 00, fax 0118-929 75 19, e-mail info@keithley.co.uk

USA: phone 440-248-0400, fax 440-248-6168, e-mail info@keithley.com

India: 080-212 80-27/-28/-29, fax 089-212 80 05, e-mail support_india@keithley.com

For all countries not listed call the KIEX department in Germany:

phone +49-89-84 93 07-0, fax +49-89-84 93 07-87, e-mail kiex_sales@keithley.com
Internet: www.keithley.com

AngelTech Live III: Join us on 12 April 2021!

AngelTech Live III will be broadcast on 12 April 2021, 10am BST, rebroadcast on 14 April (10am CTT) and 16 April (10am PST) and will feature online versions of the market-leading physical events: CS International and PIC International PLUS a brand new Silicon Semiconductor International Track!

Thanks to the great diversity of the semiconductor industry, we are always chasing new markets and developing a range of exciting technologies.

2021 is no different. Over the last few months interest in deep-UV LEDs has rocketed, due to its capability to disinfect and sanitise areas and combat Covid-19. We shall consider a roadmap for this device, along with technologies for boosting its output.

We shall also look at microLEDs, a display with many wonderful attributes, identifying processes for handling the mass transfer of tiny emitters that hold the key to commercialisation of this technology.

We shall also discuss electrification of transportation, underpinned by wide bandgap power electronics and supported by blue lasers that are ideal for processing copper.

Additional areas we will cover include the development of GaN ICs, to improve the reach of power electronics; the great strides that have been made with gallium oxide; and a look at new materials, such as cubic GaN and AlScN.

Having attracted 1500 delegates over the last 2 online summits, the 3rd event promises to be even bigger and better – with 3 interactive sessions over 1 day and will once again prove to be a key event across the semiconductor and photonic integrated circuits calendar.

So make sure you sign up today and discover the latest cutting edge developments across the compound semiconductor and integrated photonics value chain.

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