IC test equipment company Advantest plans to develop a fast, accurate
failure diagnostics solution for deep-submicron, high-speed system-on-chip
(SoC) designs using TetraMAX automatic test pattern generation (ATPG)
technology from electronic design automation (EDA) tool provider Synopsys.
The tool under development will use data communication between the company's
T6000 series ATE system and Synopsys' TetraMAX ATPG tool to streamline the
process of detecting failures.
Fujitsu Laboratories has developed a technique for vertical growth and
diameter control of multi-wall carbon nanotubes on a silicide layer for
constructing MOSFET electrodes (gate, drain, and source). Deposition was by
plasma-enhanced CVD. An electric field perpendicular to the wafer surface
induced nanotube growth aligned with the field. Varying the nickel and
cobalt content of the silicide controls the tube diameters. The company says
the technique is
INFICON, a leading manufacturer of instrumentation and process control software for the semiconductor and vacuum-coating industries and other industrial applications, today announced it has acquired Sigma Instruments Inc., a leading manufacturer of instrumentation for the measurement and control of thin film processes.
ChipSensors Ltd, a fabless semiconductor start-up company, has unveiled a breakthrough in semiconductor technology enabling the surface of the chip itself to sense parameters such as temperature, humidity, certain gases and pathogens.