Teradyne Marks 7,000th Test System Shipment
Teradyne, a supplier of automated test equipment, has announced the shipment of the 7,000th unit of its industry-leading J750 semiconductor test platform to Nations Technologies, a leading Chinese microcontroller unit (MCU) and security integrated circuit (IC) chip maker.
Manufactured in China and Japan, and deployed at all the world's leading semiconductor chip manufacturers, the Teradyne J750 tester includes wafer sort and final test solutions for microcontroller units, wireless devices, image sensors, and more. J750 testers lead the industry in quality, time to market and cost effectiveness, delivering higher throughput and increased site count, reducing single site test time and optimizing parallel test efficiency.
“Nations Technologies is the leader in the Chinese MCU and security semiconductors for cashless transactions market and part of the reason for that is quality is always our number one priority. Teradyne's J750 testers are integral to ensuring we deliver the highest quality products to our customers,” said Kan Yulun, Senior Vice President of Nations Technologies. “With the highest level of performance, the J750 helps us ensure that our final products ship on time and on spec.”
“Having had a presence in China for more than 20 years, Teradyne is honored to be a trusted partner of Nations Technologies,” said Regan Mills, Vice President at Teradyne. “We are thrilled to share this milestone with such an innovative and influential company as Nations, who has always been known for their high quality and dependability.”Teradyne's J750 family is the leading MCU device testing solution for automotive and consumer applications, and leads the world in image sensor testing. The J750 is relied upon by automotive semiconductor suppliers to provide repeatable and reliable device test results and utilizes Teradyne's award-winning IG-XL™ software platform to help verify test programs critical for the automotive market. With a ‘zero footprint' design, the J750 is the gold standard for test quality as semiconductor manufacturers pursue zero-defects and multisite throughput.
In addition, the IG-XL software platform is critical for rapid program development. It automatically scales to support multisite testing, saving significant development time and cost, and enables thirty percent faster development of multisite test programs compared with competitive ATE software systems.