Neuralink selects Takano Wafer Particle Measurement System
ClassOne Equipment has announced the sale of its advanced new Takano particle measurement system to Neuralink Corp., the California-based developer of leading-edge brain-computer interfaces. The announcement was made by ClassOne Equipment’s Vice President, David Pawlak.
“Neuralink chose the Takano WM-7SR system for high-precision wafer particle detection in their 150mm fab in Fremont, California," said Pawlak. “The tool was selected after it performed successfully on a range of tests on Neuralink bare-silicon and blanket-filmed wafers. The equipment’s extensive functionality as well as its attractive price and delivery time were also key factors in the company’s final decision.”
Pawlak pointed out that Takano-brand particle detection systems are rapidly gaining attention in the semiconductor industry because they have become the new-technology replacement for legacy Surfscan® systems. The Takano WM-7SR is specifically designed to deliver advanced particle measurements on ≤200mm unpatterned wafers. The tool is capable of providing best-in-class detection sensitivity along with high throughput, excellent repeatability and a suite of options that includes Map Overlay, Haze Measurements, X/Y Coordinate Output, and more.
ClassOne Equipment is the exclusive source for sales, service and complete support of Takano particle detection systems in North America and Europe. ClassOne maintains a team of specially-trained field engineers to provide installations, PMs and all other services on Takano systems.
Neuralink is a developer of ultra-high bandwidth brain-machine interfaces to connect humans and computers. The company’s fully implantable, cosmetically invisible brain-computer interfaces will allow people with paralysis to regain independence through the control of computers and mobile devices.
