Loading...
News Article

Introducing Park FX200

News

AFM for 200 mm samples from Park Systems.

Park Systems has released its latest atomic force microscopy (AFM) innovation, Park FX200, designed for 200 mm samples. The FX200 is developed to meet the needs of both research and industrial applications, offering significant advancements in large-sample AFM technology.

Park FX200

The FX200 features an advanced mechanical structure that ensures a significantly lower noise floor and minimal thermal drift, providing increased stability during measurements. This enhancement promotes greater accuracy and reliable performance over extended operation periods.

With faster Z servo performance, the FX200 enables rapid and precise scanning across large sample areas. Its enhanced high-power sample view with autofocus allows researchers to achieve exceptional clarity and detail in AFM imaging, regardless of sample type or condition.

The FX200 includes several automated features to streamline operations and maximize efficiency. Automatic probe recognition and exchange eliminate manual adjustments, while a reduced laser spot size and automatic alignments improve measurement accuracy and consistency.

Macro optics provides a full 200 mm sample view, allowing comprehensive analysis without the need for stitching multiple images. This capability is enhanced by automatic sequential measurements at predefined coordinates, facilitating efficient data collection across large sample areas.

Park FX200 is designed with user convenience in mind, featuring automatic AFM scan parameter settings. This intuitive interface allows researchers to focus on their scientific objectives rather than instrument configuration, enhancing productivity and workflow efficiency.

Furthermore, its superior performance capabilities make it ideal for a wide range of research and industrial applications, including investigating surface morphology, characterizing mechanical properties, and exploring nanoscale phenomena, delivering reliable results for contemporary scientific endeavors. Representing a significant advancement in AFM technology, Park FX200 offers enhanced precision, automated efficiency, and comprehensive sample visualization.

Silicon photonics: accelerating growth in the race for high-speed optical interconnects
CCD-in-CMOS technology enables ultra-fast burst mode imaging
2025 6G A look forward
Critical Manufacturing climbs Deloitte’s Technology Fast 50
Semiconductors: The most important thing you probably know the least about
Imec and partners unveil SWIR sensor with lead-free quantum dot photodiodes
Lattice introduces small and mid-range FPGA offerings
SEMI and SMT inspection solutions at NEPCON Japan 2025
Nordic Semiconductor and Kigen demonstrate Remote SIM Provisioning for Massive IoT
Spirent collaborates with Siemens
Quobly forges strategic collaboration with STMicroelectronics
New standards in pressure measurement systems for the semiconductor industry
IBM delivers optics breakthrough
Semiconductor equipment sales to reach $139 Billion in 2026
Marvell introduces 1.6 Tbps LPO Chipset
ACM research strengthens Atomic Layer Deposition portfolio
CEA-Leti demonstrates embedded FeRAM platform compatible with 22nm FD-SOI node
Lattice introduces small and mid-range FPGA offerings
Solace unlocks full potential of event-driven integration
Advantest to showcase latest test solutions at SEMICON Japan 2024
CEA-Leti device integrates light sensing and modulation
Nordic launches Thingy:91 X prototyping platform for cellular IoT and Wi-Fi locationing
Imec achieves seamless InP Chiplet integration on 300mm RF Silicon Interposer
High-precision SMU
Powering India’s energy future
China’s Nvidia probe puts global investors ‘on notice’
POET Technologies appoints new director
Imec demonstrates core building blocks of a scalable, CMOS-fab compatible superconducting digital technology
Imec proposes double-row CFET for the A7 technology node
ULVAC launches new deposition system
Beebolt and SEMI Announce Strategic Partnership to Drive Supplier Resilience and Agility
esmo group introduces Automated Final Test Manipulator
×
Search the news archive

To close this popup you can press escape or click the close icon.
Logo
x
Logo
×
Register - Step 1

You may choose to subscribe to the Silicon Semiconductor Magazine, the Silicon Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: