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Yield Management Buy Ups

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PDF Solutions has signed a definitive agreement to acquire IDS Software Systems based in California.

PDF will acquire IDS for $20.0mn in cash and 2,500,000 shares of PDFs Common Stock, resulting in an aggregate consideration value of approximately $50.6mn, based on June 19, 2003, closing prices. In addition, PDF will assume all of IDS stock options outstanding immediately prior to the close of the transaction. PDF currently expects the transaction to close in August, subject to customary closing conditions.



PDF will acquire IDS dataPOWER enterprise yield management system (YMS) solution. dataPOWER offers enterprise data management with statistical analysis and reporting capabilities.



PDF wants to combine this with its integration ramp infrastructure products. The company also intends to continue to sell the dataPOWER software as stand-alone products.



PDF has also completed acquisition of “WAMA” technology from WaferYield. Future payments up to a pre-determined maximum will be dependent upon reaching certain performance and revenue milestones related to the WAMA technology.



The WAMA product offering, derived from the words WAfer MAp, is designed to optimise semiconductor wafer shot maps to help customers achieve greater yield and net die per wafer, higher stepper throughput and reduced probe test costs.



PDF also intends to continue to sell the WAMA offering as a stand-alone product in addition to offering it as an option in PDFs integrated yield ramp engagements.



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VIEW SESSIONS
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Panasonic Microelectronics Web Seminar
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GOODFELLOW Confirms Membership In The BSI UK Graphene Group
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Obducat Receives Order For Fully Automated Resist Processing Tool From A Customer In Asia
AP&S Expands Management At Beginning Of 2021
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ITRI And DuPont Inaugurate Semiconductor Materials Lab
Will Future Soldiers Be Made Of Semiconductor?
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New Plant To Manufacture Graphene Electronics
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Changes In The Management Board Of 3D-Micromac AG
Imec Demonstrates 20nm Pitch Line/Space Resist Imaging With High-NA EUV Interference Lithography

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