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Alliance For 90nm Photomask Defect Handling

KLA-Tencor and Carl Zeiss Microelectronic Systems have established an alliance on next-generation photomasks for the 90nm and below technology nodes. The joint-development is aimed at providing the most comprehensive and cost-effective solution available to detect, review and disposition defects on advanced reticles. The companies plan to fully integrate reticle inspection, testing, metrology, review and defect dispositioning.
KLA-Tencor and Carl Zeiss Microelectronic Systems have established an alliance on next-generation photomasks for the 90nm and below technology nodes. The joint-development is aimed at providing the most comprehensive and cost-effective solution available to detect, review and disposition defects on advanced reticles. The companies plan to fully integrate reticle inspection, testing, metrology, review and defect dispositioning.


The aim is to tackle not only traditional defects that print upon first use but also the progressive defects that can arise throughout the reticle lifecycle. Resolution enhancement technologies (RETs) used to extend the life of 248nm and 193nm lithography tools create increasingly complex mask features that have a greater likelihood of printing yield-limiting defects during IC fabrication.


The work will involve enabling bi-directional information sharing between KLA-Tencor's TeraScan, TeraStar and STARlight reticle inspection systems, and Carl Zeiss SMT's AIMS fab and AIMS fab plus systems for both 248nm and 193nm wavelengths. This will allow reticle defect data and images captured by KLA-Tencor's inspection systems to be used by Carl Zeiss SMT's review and disposition tools. The results can then be fed back.


The interlink is intended to be retrofitable. Demonstrations of the new solution will begin in October 2003 in Germany and California.



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