News Article
Metryx proud to win IC award
The company receives two IC Industry Awards from EuroAsia Semiconductor.
Metryx, a supplier of mass metrology equipment to the semiconductor manufacturing industry, announced that it has been recognised twice by EuroAsia Semiconductor at the 2008 IC Industry Awards, presented at this year’s SEMICON Europa. The new awards follow the Start-up of the Year Award received from EuroAsia Semiconductor in 2007.
The Metryx Mentor, which brings the company’s unique mass metrology technology to semiconductor manufacturers, was named Best Yield Management Tool. Rob Wilby, a co-founder and CTO of Metryx, was honoured as Semiconductor Engineer of the Year for his role in inventing and developing mass metrology for leading edge semiconductor applications.
“This dual recognition, for both product and engineer, highlights the value that Metryx brings to the metrology marketplace, and we are honoured to have received both awards,” stated Dr. Adrian Kiermasz, president and CEO of Metryx. “The Best Tool Award for the Metryx Mentor, as determined by our customers and peers, validates the effectiveness of mass metrology’s approach to yield management. Having Rob honoured personally for his role in bringing this key new technology to market further highlights the strength of engineering that goes into Metryx’s products.”
“This is the second year in a row that Metryx has been recognised by the readers of EuroAsia Semiconductor,” said David Ridsdale, Editor-in-Chief of EuroAsia Semiconductor. “Conceptually, mass metrology is a refreshingly simple process that will have an extremely positive impact on process and cost control. We’re extremely pleased to not only recognise the company for its accomplishments to date, but to also recognise the individual, Rob Wilby, who has developed and simplified this complex technology to deliver recognised benefit to the fab.”
The Metryx Mentor, which brings the company’s unique mass metrology technology to semiconductor manufacturers, was named Best Yield Management Tool. Rob Wilby, a co-founder and CTO of Metryx, was honoured as Semiconductor Engineer of the Year for his role in inventing and developing mass metrology for leading edge semiconductor applications.
“This dual recognition, for both product and engineer, highlights the value that Metryx brings to the metrology marketplace, and we are honoured to have received both awards,” stated Dr. Adrian Kiermasz, president and CEO of Metryx. “The Best Tool Award for the Metryx Mentor, as determined by our customers and peers, validates the effectiveness of mass metrology’s approach to yield management. Having Rob honoured personally for his role in bringing this key new technology to market further highlights the strength of engineering that goes into Metryx’s products.”
“This is the second year in a row that Metryx has been recognised by the readers of EuroAsia Semiconductor,” said David Ridsdale, Editor-in-Chief of EuroAsia Semiconductor. “Conceptually, mass metrology is a refreshingly simple process that will have an extremely positive impact on process and cost control. We’re extremely pleased to not only recognise the company for its accomplishments to date, but to also recognise the individual, Rob Wilby, who has developed and simplified this complex technology to deliver recognised benefit to the fab.”
