Hitachi High-Technologies is celebrating 50 years of supply of Hitachi electron microscopes into Europe. Hitachi's continuous programme of R&D ensures that the latest electron imaging and analysis tools and techniques areavailable for research, materials science and nanotechnology.
Hitachi has always prided itself on beingat the forefront of EM technology. The company developed the first commerciallyavailable Field Emission SEM in 1972, the HFS-2, and has consistently offered the world's highest resolution instruments. At the other end of the scale, Hitachi pioneered tabletop variable pressure scanning electron microscopy with the launch of theTM-1000 in 2005, which has brought a new level of simplicity to electron microscopy.
In addition, Hitachi has registered more electron microscope inventions and patents than any other organization. Of course Hitachi also has anenviable record in transmission electron microscopy, having produced the first TEM to resolve <1Å as well as the world's first 3 MeV microscope.
Hitachi's commitment to producing electron and ion beam instrumentation of the highest performance is reflected in thecurrent portfolio of TEM, STEM and SEMs, with cold field emission (CFEG) guntechnology leading the way in the high-end range. The recent launch of theNB5000 FIB-SEM has brought a new and unique perspective to multiple beaminstruments. Advancesin the company's unique ExB detection technology, coupled with superior low voltage performance from the cold field emission gun, make the new SU8000 andS-5500 the pinnacle of high resolution SEMs. The combination of field emission technology with variable pressure flexibility in the new SU6600 Schottky VP-SEM gives analytical results with stability and sensitivity.