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News Article

Rudolph increases yield

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Rudolph announced that it has acquired selected assets of MKS Instruments' Yield Dynamics Software Business.

Rudolph Technologies has reported that it has acquired selected assets of the Yield Dynamics software business from MKS Instruments. The purchase includes selected assets and intellectual property (IP) related to MKS yield management software used by semiconductor manufacturers and fabless semiconductor suppliers. In addition to acquiring the software assets, approximately 35 engineering and applications personnel, most of whom are based in Tianjin, China, will join Rudolph's Data Analysis and Review Business Unit.

"The products and technology include patented analytical techniques for yield improvement that are complementary to our existing yield management and process control portfolio," stated Mike Plisinski, Rudolph's vice president and general manager, Data Analysis and Review Business Unit. "In addition to the technology, we welcome the China personnel to our growing applications and product development team."

As processes become more challenging, manufacturers are becoming more dependent on data management systems to deliver fast and accurate process information analysis designed to automate decision-making and optimize yield. The Yield Dynamics package includes Genesis® Enterprise software, a fabwide yield management solution that combines parametric and yield optimization in a unified platform with data mining and workflow development across all data sources.

Terms of the cash transaction are undisclosed. Rudolph does not expect the transaction to have any material impact on its operations for the remainder of the year or an impact on any previous financial guidance provided by the company.

Rudolph Technologies, Inc. is a worldwide leader in the design, development, manufacture and support of defect inspection, process control metrology, and data analysis systems used by semiconductor device manufacturers worldwide. Rudolph provides a full-fab solution through its families of proprietary products that provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down costs and time to market. Rudolph offers yield management solutions used in wafer processing and final manufacturing through a family of systems for macro-defect inspection (detection and classification), as well as transparent and opaque thin film measurements.

The company has enhanced the competitiveness of its products in the marketplace by anticipating and addressing many emerging trends driving the semiconductor industry's growth. Rudolph's strategy for continued technological and market leadership includes aggressive research and development of complementary inspection and metrology solutions.

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