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EDAX unveils SDD series for fast, high quality electron microscopy analysis

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The Octane Series silicon drift detectors (SDD) for EDS Analysis Systems on electron microscopes promise to deliver high-quality data at previously unachievable speeds.

Materials characterisation systems supplier, EDAX, US, has introduced the new Octane Series silicon drift detectors (SDD) for its TEAM EDS Analysis Systems on electron microscopes.


By incorporating the latest advancements in SDD technology, the company says the Octane SDD family delivers high-quality EDS data at previously unachievable speeds.


Until now, the potential speed advantages of SDD technology have been unrealised due to losses in data quality at high count rates.


But with the Octane Series, EDAX says customers are no longer forced to choose between fast data collection and high-quality results; they can now benefit from both to maximize their materials insight.

The Octane Series includes four models"”the Pro, Plus, Super and Ultra"”that are designed specifically to meet the demands of key microanalysis applications.


At the core of the Octane family is an advanced spectrometer design and state-of-the-art electronics that enable energy resolution down to 121 eV with world-class efficiency in converting input counts into stored data.

Pairing the new SDD technology with EDAX's TEAM EDS software also allows users to take advantage of the Smart Features in TEAM Systems to optimise their analysis time and get the best data possible from their sample.


"At EDAX, we believe that users should not have to compromise in their efforts to understand their materials. Extraction of high-resolution quantitative analysis is now possible from a map collected at 200,000 counts per second," comments Mike Coy, technical product manager for Microanalysis at EDAX. "The ability to collect X-rays faster while maintaining the quality of underlying data allows our users to focus more of their valuable time on new materials discoveries."

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