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Friday 9th November 2012
GaN Power Devices Built on 6-inch Si Wafer
Wednesday 7th November 2012
Tuesday 6th November 2012
Real-time chamber clean and endpoint detection increases the availability of the tools and lowers the cost of ownership
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Tuesday 6th November 2012
Thursday 1st November 2012
Thursday 1st November 2012
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Wednesday 31st October 2012
Wednesday 31st October 2012
Wednesday 31st October 2012
'Crushed' porous silicon anodes exhibit a dramatic increase in charge-discharge cycles
Tuesday 30th October 2012
A novel processing method will help pave the way for carbon technology as a viable alternative to silicon in future computing
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Tuesday 30th October 2012
A joint-development program between the two companies will extend applications for detecting defects and impurities in semiconductor chips

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