UK consortium seeks to create nano-roughness standard
The UK-based consortium has been awarded the funding for a project on semiconductor and optical layer analysis and definition using interference microscopy (SOLADIM). The aim of the programme is to help develop measurement techniques and international specifications for surface texture measurement of epitaxial wafers and thin film optical coatings.
The project will be co-ordinated by the lead partner, Taylor Hobson, who will provide its Talysurf CCI non-contact measurement solutions for the demanding applications carried out by companies such as epitaxial wafer foundry IQE and magnetron optical coating tool specialist Applied Multilayers. The Talysurf CCI technology will allow the establishment of international standards for nano-surface roughness.
