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News Article

Hungarian firm takes over US metrologist

Hungarian semiconductor materials metrology company Semilab has completed the acquisition of substantially all of the assets of SemiTest, a US based manufacturer of semiconductor metrology systems. The transaction was structured as a purchase of all assets related to SemiTest's Surface Charge Analyzer (SCA) and epitaxial growth metrology (Epimet) product lines for an undisclosed cash amount.
Hungarian semiconductor materials metrology company Semilab has completed the acquisition of substantially all of the assets of SemiTest, a US based manufacturer of semiconductor metrology systems. The transaction was structured as a purchase of all assets related to SemiTest's Surface Charge Analyzer (SCA) and epitaxial growth metrology (Epimet) product lines for an undisclosed cash amount.

Semilab has formed a new division with worldwide responsibility for development and marketing of metrology solutions for the semiconductor device manufacturing market. The new business unit, named SemiTest Division, will be housed in a new facility in Billerica, Massachusetts. The operation will provide continuity of support for legacy product lines recently acquired from SemiTest and will also develop new products by integration of innovative measurement technology from the European parent company into the advanced SemiTest 200mm and 300mm metrology systems.

Donna Tinsley, chief financial officer of SemiTest, comments: "The longer than expected recession coupled with our aggressive new product development program caused a severe financial problem for us. We realised that we could no longer continue on our own. Our goal was to find a single purchaser committed and able to carry forward our innovative technology and most importantly offer our many users in the industry a secure alternative means of support long into the future. Following many months evaluating several offers we finally decided that Semilab's offer fulfilled all our criteria."

The SCA tool analyses the quality of dielectric thin film growth on silicon. The installed base consists of over 170 systems worldwide. The Epimet system for non-contact CV profiling of epitaxial layers was recently introduced and is now used by at least four of the leading wafer makers and increasingly by device makers.

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