News Article
Bede appoints new chairman
UK metrology tool supplier Bede has appointed Stuart McIntosh as non-executive chairman of the board. Previous chairman Norman Price OBE will remain with the company as a non-executive director.
UK metrology tool supplier Bede has appointed Stuart McIntosh as non-executive chairman of the board. Previous chairman Norman Price OBE will remain with the company as a non-executive director.
McIntosh is a veteran of the semiconductor industry, bringing considerable technical and business expertise to the company. In addition to his new role with Bede, he is also executive vice president of operations at Dutch lithography equipment supplier ASML.
McIntosh has also had stints as chief operating officer of Philips Semiconductors and worldwide director of operations at GEC.
"Stuart is highly regarded in the semiconductor industry, and brings with him a wealth of senior management and operational experience, as well as an intimate knowledge of Bede's customers," said Bede chief executive Dr Neil Loxley.
Commenting on his new appointment, McIntosh said. "I am delighted to join the dedicated staff at Bede during this time of great potential in the semiconductor industry. As the industry moves beyond the 90nm node, yield enhancement is becoming even more critical, driving X-ray metrology to the forefront."
McIntosh is a veteran of the semiconductor industry, bringing considerable technical and business expertise to the company. In addition to his new role with Bede, he is also executive vice president of operations at Dutch lithography equipment supplier ASML.
McIntosh has also had stints as chief operating officer of Philips Semiconductors and worldwide director of operations at GEC.
"Stuart is highly regarded in the semiconductor industry, and brings with him a wealth of senior management and operational experience, as well as an intimate knowledge of Bede's customers," said Bede chief executive Dr Neil Loxley.
Commenting on his new appointment, McIntosh said. "I am delighted to join the dedicated staff at Bede during this time of great potential in the semiconductor industry. As the industry moves beyond the 90nm node, yield enhancement is becoming even more critical, driving X-ray metrology to the forefront."
