Suite for 45 nm and 32 nm Manufacturing Launch
ATDF, a technology R&D centre for the semiconductor industry, unveiled a suite of test products designed to help semiconductor manufacturers and equipment makers prepare for advanced technology generations.
The products, designed for calibrating tools and testing wafer products that will serve the 45 nm and 32 nm microchip generations, include an advanced reticule, two test wafers, and two lines of proprietary films for dual-metal gates and high-k development. All have received initial orders or are close to rollout.
"Our industry is already entrenched in 65 nm manufacturing and the pressure is on to prepare tools and processes for the succeeding generations," said Dave Anderson, ATDF general manager. "These products will help both chip-makers and tool suppliers make the transition to 45 nm and 32 nm capability."
