BedeMetrix-F selected for 65nm process in Asia
Bede X-ray Metrology, a global provider of X-ray metrology systems to the semiconductor industry, is pleased to announce that a major Asian semiconductor manufacturer has selected the BedeMetrix-F system for metrology on their leading-edge 65nm process. They have chosen Bede for their production proven expertise in X-ray metrology, which is essential for developing and controlling advanced processes.
The Asian semiconductor manufacturer will perform a short evaluation of the tool while it is optimised to meet their measurement needs on product wafers. Following this evaluation, Bede expects to have a long and successful collaboration with the manufacturer as the process is rolled out to its other fabs.
Dr Neil Loxley, Chief Executive Officer for Bede commented, "This exciting opportunity validates the necessity of X-ray metrology as the global semiconductor industry transitions to the 90nm and 65nm technology nodes. It proves that Bede's unique production-proven measurement capabilities on product wafers meet current manufacturing requirements, while providing advanced metrology for future generations. We look forward to working with this company in developing their capabilities in semiconductor manufacturing."