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SUSS MicroTec and Instrument Systems announce alliance

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SUSS MicroTec and Instrument Systems announced their partnership for developing a next-generation, high-throughput test system for LED devices at wafer level. It will enable manufacturers to test up to 70,000 LED dies per hour.

SUSS MicroTec and Instrument Systems announced their partnership for developing a next-generation, high-throughput test system for LED devices at wafer level. It will enable manufacturers to test up to 70,000 LED dies per hour.

The demand for LED devices is growing exponentially as the devices replace older technologies in everyday applications. This means that time-to-market and production costs for an LED device are critical for the manufacturer. In order to achieve cost-effective production, manufacturers are increasingly using on-wafer testing to prevent the packaging of bad devices – a costly error. Additionally, speed is critical for meeting the demands of the consumer on time.

The new test system from SUSS MicroTec and Instrument Systems is being designed to meet these demands from LED manufacturers. “We did not simply combine the fastest spectroradiometric LED measurement equipment with the industry’s leading high-speed probe system. With this innovative solution, we are leveraging our combined know-how in LED testing to optimize throughput, achieving speeds never seen before,” said Dr. Thomas Attenberger, LED-Product Manager at Instrument Systems.
“We are excited to have Instrument Systems as our partner,” said Dr. Claus Dietrich, Division Manager of Test Systems at SUSS MicroTec. “They share our commitment to innovation, quality and customer satisfaction, all of which are important factors in the success of this project.”

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