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Nanometrics to stay in patent litigation with KLA-Tencor

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Nanometrics Incorporated, supplier of advanced integrated and standalone metrology equipment to the semiconductor industry, announced its motion to stay in the patent litigation case brought by KLA-Tencor Corporation had been granted by Judge Jeffrey White in the U.S. District Court for the Northern District of California.
Nanometrics Incorporated, supplier of advanced integrated and standalone metrology equipment to the semiconductor industry, announced its motion to stay in the patent litigation case brought by KLA-Tencor Corporation had been granted by Judge Jeffrey White in the U.S. District Court for the Northern District of California.

In August 2005, Nanometrics was served with a complaint alleging that certain of its products infringed the intellectual property of KLA-Tencor. Nanometrics has upheld the belief that none of its products infringe any intellectual property of KLA-Tencor and has maintained that it intends to vigorously and aggressively defend itself in the litigation. As part of such defence, Nanometrics filed a request for re-examination of the two allegedly infringed KLA-Tencor patents with the U.S. Patent & Trademark Office (PTO). These requests for re-examination were recently accepted for review by the PTO. Subsequent to the original claim, KLA-Tencor added a third patent to their complaint. The stay issued by the court covers all three of the patents in the suit.
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