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News Article

SEMI publishes eight new technical standards

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SEMI has published eight new technical standards applicable to the semiconductor, flat panel display (FPD) and MEMS manufacturing industries. The new standards, were developed by technical experts from equipment suppliers, device manufacturers and other companies participating in the SEMI International Standards Program.

SEMI Standards are published three times a year. The new standards, part of the July 2006 publication cycle, join more than 720 standards that have been published by SEMI during the past 33 years.

The standards include safety guidelines for hydrogen peroxide storage and handling systems, specifications for critical dimension (CD) measurement information data for photomask manufacturing, and test methods for measurement of the resistivity of resin black matrix for LCD colour filters.

"These new standards, which include several specifications applicable to the flat panel display (FPD) manufacturing industry, will help reduce manufacturing costs and speed time-to-market," said Bettina Weiss, SEMI director of International Standards.

In addition the SEMI S2 safety specification is being updated with additional and corrected material from the last two years. This version of SEMI S2 is the first in a planned tri-annual revision process, with the next SEMI S2 update scheduled for 2009.

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