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News Article

High-end multi-functional crossBeam workstation for materials analysis

News
Carl Zeiss SMT´s Nano Technology Systems division (Carl Zeiss NTS) and SII NanoTechnology Inc. (SIINT) jointly introduce the NVision 40, the latest member of the industry proven CrossBeam family of combined scanning electron and focused ion beam workstations. The NVision 40 is designed to meet even most ambitious demands in semiconductor, materials and life science applications. By combining the outstanding core technologies of GEMINI electron beam technology, focused ion beam (FIB) and gas injection system (GIS) technology of both market leaders, NVision 40 offers unprecedented product capabilities for cutting-edge nanoscopic imaging, structuring and analysis.

Dr. Dirk Stenkamp, Managing Director of Carl Zeiss NTS, states: "After the successful launch of the XVision 300 at Semicon West 2006, we are proud to announce yet another joint product from our strategic alliance with SIINT. By combining our most accomplished core competencies, the NVision 40 emphasizes our technical leadership and accelerated power to innovate. This will enable our customers to meet and exceed current and future demands in nanotechnology fast and efficiently."

Dr. Hiroyuki Funamoto, President & CEO of SIINT, adds : "With NVision 40 we are convinced to offer the ultimate solution to the market for a broad variety of demanding applications in semiconductor manufacturing and nanotechnology."

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