News Article
Metrology Underperforming Overall Equipment Market in 2006
In an effort to cut expenses, semiconductor manufacturers are minimizing metrology/inspection purchases in 2006, according to the report "Metrology, Inspection, and Process Control in VLSI Manufacturing", recently published by The Information Network.
For 2006, the process control sector will underperform the semiconductor equipment market, growing 9.6%, compared to an overall growth rate of 15.8% for the industry. Semiconductor yields have reached a level that sampling of wafers is relaxed in 2006, as end users (semiconductor manufacturers) find ways to minimize capital expenditures.
"Throughput has increased so that many of the metrology/inspection tools can process more than 130 wafers per hour. Faster measurements reduce the required metrology capacity, saving both capital expense and cleanroom space," notes Dr. Robert N. Castellano, President of The Information Network. "Simply put, the performance of the current crop of metrology/inspection systems have gotten too good."
The Macro Defect Detection sector is the only bright spot. This sector grew 63% in 2005 compared to a revenue decrease of 1.5% for the overall inspection/metrology market and a 9.5% decrease for the overall front-end equipment market. August Technology led the market with a 32% share, and when combined with Rudolph's share resulted in a 44% share for the new entity. Unfortunately for the industry, Macro Defect Detection is now overcrowded with vendors and represents a mere 3.3% of the overall metrology/inspection market.
"Semiconductor manufacturers are also deferring purchase of Integrated Metrology tools in favor of Standalone equipment for thin film measurements," added Dr. Castellano. "This enables them to sample only some sites on some wafers."
"Throughput has increased so that many of the metrology/inspection tools can process more than 130 wafers per hour. Faster measurements reduce the required metrology capacity, saving both capital expense and cleanroom space," notes Dr. Robert N. Castellano, President of The Information Network. "Simply put, the performance of the current crop of metrology/inspection systems have gotten too good."
The Macro Defect Detection sector is the only bright spot. This sector grew 63% in 2005 compared to a revenue decrease of 1.5% for the overall inspection/metrology market and a 9.5% decrease for the overall front-end equipment market. August Technology led the market with a 32% share, and when combined with Rudolph's share resulted in a 44% share for the new entity. Unfortunately for the industry, Macro Defect Detection is now overcrowded with vendors and represents a mere 3.3% of the overall metrology/inspection market.
"Semiconductor manufacturers are also deferring purchase of Integrated Metrology tools in favor of Standalone equipment for thin film measurements," added Dr. Castellano. "This enables them to sample only some sites on some wafers."
