+44 (0)24 7671 8970
More publications     •     Advertise with us     •     Contact us
*/
News Article

Keithley and Mesatronic to advance parametric wafer probe technology

News
Keithley Instruments, Inc. announced it has partnered with Mesatronic Group to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications.

William Merkel, Marketing Director for the Keithley Parametric Test Product Group, said, "When the new probe cards are available later this year, they can be used with Keithley parametric testers for simultaneous extraction of RF and very low level DC current parameters on any combination of probe pins that contact a semiconductor wafer."

The probes for these cards will also be suitable for the smaller 30-micron test pads toward which the industry is migrating. Currently, performing simultaneous low current DC and RF measurements is complicated by the fact that existing cards have only a few dedicated RF probe pins, and they cannot be used for accurate low current DC measurements.

×
Search the news archive

To close this popup you can press escape or click the close icon.
Logo
×
Logo
×
Register - Step 1

You may choose to subscribe to the Silicon Semiconductor Magazine, the Silicon Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: