News Article
Hyphenated systems unveils new nanoscale profiler
Hyphenated Systems announced the release of its new NanoScale Optical Profiler.
Hyphenated Systems announced the release of its new NanoScale Optical Profiler.
The system incorporates Hyphenated Systems’ Confocal Microscopy (ACM) technology that acquires and displays high-resolution (<50nm) three-dimensional images in seconds. The system is ideal for 3D imaging and metrology of rough or sloped surfaces of MEMS and other semiconductor devices, or imaging subsurfaces through transparent materials.
“By adding automation makes it a valuable tool in applications that require a large number of repetitive, routine operations, said Terence Lundy, Hyphenated Systems’ vice president and general manager.
The NanoScale Optical Profiler acquires a series of images that slice through the sample at varying heights, then combines these images into a three-dimensional model of the sample. Its ability to collect data simultaneously through multiple confocal apertures accelerates the data acquisition process, allowing it to construct and display 3D images in seconds.
