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Vistec delivers First infrared inspection and review system to Japan

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A Japanese sensor manufacturer ordered two fully automated infrared inspection and review systems IRIS2000, worth more than a million Euro.
A Japanese sensor manufacturer ordered two fully automated infrared inspection and review systems IRIS2000, worth more than a million Euro. Vistec Semiconductor Systems (previously Leica Microsystems Semiconductor) already delivered the first tool in December 2006.

The brandnew IRIS2000 will be used to control glued wafers in the customer's production. Inspection with infrared light enables to see "through" Silicon wafers. Therefore, infrared inspection can detect defects which are not visible by any other illumination method.

"Our reliable inspection system offers process engineers a tool to identify defects located in the glueing layer between the wafers", explains Product Manager Andreas Machura.

The IRIS2000 will be used in a production line where each sensor must be inspected. Therefore, the high throughput of up to 12,000 dies per hour was a decisive factor for the Japanese customer to choose the infrared inspection and review system. The effective and user-friendly software was a further factor that sealed the deal for Vistec", says Vistec General Manager Gerhard Ruppik.
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