Opening of new nanotechnology demonstration centre in Japan announced
Carl Zeiss SMT and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments jointly celebrated the opening of the new Yokohama Nanotechnology Demonstration Centre.
The Demonstration Centre features the electron and ion beam products of both companies, namely Scanning Electron Microscopes (SEM), Focused Ion Beam systems (FIB), FIB-SEM Hybrid Systems as well as Transmission Electron Microscopes (TEM). A total of over 50 guests, including representatives of Customers in Japan and representatives from the German Embassy and the German Chamber of Commerce and Industry in Japan, took part in the festive inauguration ceremony.
The Nanotechnology Demonstration Centre is seen as a step to develop nanotechnology solutions by implementing the global strategic alliance of Carl Zeiss SMT and SIINT announced last year. It was just over a year ago that SIINT began to sell and service products of Carl Zeiss SMT´s Nano Technology Systems division (NTS) in Japan, followed by the launch of joint product developments during summer 2006.
