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Marking the mile for adoption of parametric probe card
FormFactor Inc has announced a major milestone for its Takumi parametric wafer probe card, which has now been adopted by 20 leading device manufacturers worldwide.
FormFactor Inc has announced a major milestone for its Takumi parametric wafer probe card, which has now been adopted by 20 leading device manufacturers worldwide.
Takumi probe cards are an advanced probing solution used by IC manufacturers for in-line and end-of-line parametric testing. The Takumi probe card extends FormFactor’s probe card technology and expertise further into the front end of the semiconductor manufacturing process—giving IC manufacturers earlier insight into opportunities to validate their designs, verify process performance and achieve higher yields.
“Since its introduction 18 months ago, our Takumi parametric solution has seen significant adoption among leading IC manufacturers worldwide due to its ability to meet the stringent performance and cost-of-ownership requirements for parametric testing in today’s advanced production fabs,” stated Igor Khandros, chief executive officer of FormFactor. “Our Takumi parametric solution brings many of the benefits of our wafer sort probe card technology to parametric test, and represents a key component in FormFactor’s strategy to lower the cost of test in both mainstream and emerging wafer probe applications.”
