News Article
Credence expands 45nm product range for semiconductor manufacturers
Credence Systems, a provider of test and analytical solutions from design to production for the semiconductor industry, has announced additions to its range of integrated analytical tools designed to meet the complex challenges facing manufacturers of today's advanced 65nm, 45nm and beyond device technologies.
"Localisation of electrical defects at the 65nm and 45nm technology nodes requires much higher spatial and signal resolution, beyond anything that conventional techniques have been able to offer. The exponential increase in design complexity also makes circuit analysis extremely challenging. All of this is a significant concern for our customers trying to achieve today's stringent time-to-market and profitability goals," stated Tameyasu Anayama, general manager of Credence Systems' Diagnostic Group. "The introduction of these leading-edge systems provides our customers with a complete range of integrated analytical tools and capabilities to effectively meet the challenges associated with analysing the most advanced technologies moving forward."
