News Article
STC continues to expand
The consortium keeps growing and adds several working groups in reflection of industry demands.
Two new working groups have been created by the Semiconductor Test Consortium (STC) as well as a chearter of an existing working group being expanded. This makes seven working groups in total being created to meet interest and demand of the industry.
The main focus of those working groups will be on portable test instrument modules (PTIM), yield enhancement and standard test interface language (STIL).
The PTIM working group has been launched by STC to leverage the vast set of open standard test instruments for use in the automated test equipment environment (ATE).
The target is to enable a quick integration of a large number of PXI and other types such as VXI, LXI etc, into ATE.
The yield enhancement working group was put into place to jointly work with other standard bodies to develop a standard for the industry for third party software tools.
Keith Arnold, Pintail Technologies’ Chief Technical Officer will chair this new working group. The groups first focus will be to provide a tester interface for yield enhancement tools. Other types will also be concidered. This effort is anticipated to enable the enhancemnet in performance for the ever more expanding production volume of the industry. Furthermore, the standards should also reduce the effort to carry any third party software tools across multiple test platforms.
IEEE STIL standards will continue to be adopted with international acceptance.
Alongside the expanding adoption of STIL, the STC has decided to expand their STIL working group participation and charter. The working group’s new chairs are from Renesas in Japan and Synopsys in the U.S. Working group efforts to date include: benchmarking STIL readers, development of a STIL valuators and test suites, and promotion of STIL tools.
The working group’s scope now encompasses the worldwide use of the IEEE STIL specifications. Central to this objective is collaborating closely with STIL user around the world, including Japan’s STIL based Semiconductor Test Action Group (SSTAG), in order to identify any specification gaps. The ultimate goal is to enable a broader adoption of the IEEE specifications amongst EDA, ATE and semiconductor companies.
“At this year’s Global STC Conference, our main focus was to investigate collaborative solutions to address today’s most current test challenges, explained STC Manager Bob Helsel. “Through this synergy, we concluded that, while we have working groups spanning the semiconductor industry, from docking and interface, to PTIM, the expansion of some of these working groups and the creation of new working groups is imperative to fully support and enable the STC ecosystem.”
The main focus of those working groups will be on portable test instrument modules (PTIM), yield enhancement and standard test interface language (STIL).
The PTIM working group has been launched by STC to leverage the vast set of open standard test instruments for use in the automated test equipment environment (ATE).
The target is to enable a quick integration of a large number of PXI and other types such as VXI, LXI etc, into ATE.
The yield enhancement working group was put into place to jointly work with other standard bodies to develop a standard for the industry for third party software tools.
Keith Arnold, Pintail Technologies’ Chief Technical Officer will chair this new working group. The groups first focus will be to provide a tester interface for yield enhancement tools. Other types will also be concidered. This effort is anticipated to enable the enhancemnet in performance for the ever more expanding production volume of the industry. Furthermore, the standards should also reduce the effort to carry any third party software tools across multiple test platforms.
IEEE STIL standards will continue to be adopted with international acceptance.
Alongside the expanding adoption of STIL, the STC has decided to expand their STIL working group participation and charter. The working group’s new chairs are from Renesas in Japan and Synopsys in the U.S. Working group efforts to date include: benchmarking STIL readers, development of a STIL valuators and test suites, and promotion of STIL tools.
The working group’s scope now encompasses the worldwide use of the IEEE STIL specifications. Central to this objective is collaborating closely with STIL user around the world, including Japan’s STIL based Semiconductor Test Action Group (SSTAG), in order to identify any specification gaps. The ultimate goal is to enable a broader adoption of the IEEE specifications amongst EDA, ATE and semiconductor companies.
“At this year’s Global STC Conference, our main focus was to investigate collaborative solutions to address today’s most current test challenges, explained STC Manager Bob Helsel. “Through this synergy, we concluded that, while we have working groups spanning the semiconductor industry, from docking and interface, to PTIM, the expansion of some of these working groups and the creation of new working groups is imperative to fully support and enable the STC ecosystem.”
