+44 (0)24 7671 8970
More publications     •     Advertise with us     •     Contact us
 
Loading...
News Article

Microscope focused on high volume and high quality

News

The new Thermo Scientific Helios 6 HD Focused Ion Beam Scanning Electron Microscope (FIB-SEM) enables site-specific, ultra-thin sample preparation, designed to produce a high volume of quality transmission electron microscopy (TEM) data to support semiconductor manufacturers’ imaging and failure analysis needs during device design and fabrication.

This latest addition to Thermo Fisher Scientific’s family of industry standard DualBeam instruments can be operated manually, or in semi-automated fashion, and offers users the opportunity to achieve an increase in productivity compared to other commercially available solutions.

Delivering more samples per hour, and more high-quality sample output than previous generations, this new solution enables failure analysis labs the potential to reduce operating costs while delivering high quality TEM samples on a wide range of device technologies.

Key Applications:

Generate large volumes of high-quality TEM samples of various complexity. Increase production yields, enhance product quality and accelerate time to market.

Features/Benefits:

New FIB column design with automated source and column alignments enables higher system availability for increased productivity and more consistent results.

New digital scanning and patterning engine allows for simultaneous SEM imaging and milling, a 50X improvement in scan rotation precision and a more than 2X improvement in cut placement for more accurate pattern positioning, end-pointing on regions of interest and more successful TEM data samples compared to previous generations.  

New Thermo Scientific AutoTEM 6 Software supports achievement of a 45% decrease in setup time, and many productivity-and-ease-of-use improvements, including AI-enabled grid management and automatic alignment compared to previous generations.

New Thermo Scientific EasyLift NanoManipulator enables 3X longer intervals between needle change and therefore a 50% reduction in needle replacement time compared to previous generations.

Elke Reichart takes on Infineon's digital transformation board role
Big data analytics market Size to hit $47.2 billion
Ansys solutions certified for UMC's 3D chip technology
Microscope focused on high volume and high quality
Busch Vacuum acquires centrotherm clean solutions
Mouser Electronics adds over 16,000 new parts
Supermicro starts superchip-based server shipments
GlobalFoundries awarded $35m US funding
Controllable nonlinearity and coherence of polaritons in monolayer TMDs mesa cavities
Customised layers
Ansys receives four TSMC 2023 OIP Partner of the Year Awards
4JM Solutions expands Advantest relationship
Samsung Electronics holds Memory Tech Day 2023
Arm and Synopsys strengthen partnership
Solid Silicon Corp and Raptor Computing Systems collaborate
Atomera’s provides CHIPS expertise
Alphawave Semi, AI and Arm combine
Nordson Test & Inspection unveils next-gen X-Ray Inspection System
Ardian launches semiconductor investment platform
Infineon completes acquisition of GaN Systems
Mass Extraction detects the smallest defect sizes
TRI expands in Southeast Asia
SEMIFIVE Signs MOU with TeraPixel Technologies
EMD Electronics opens Arizona factory
SCREEN Semiconductor Solutions adopts FTD’s software platform
Synopsys partners with Indian Institute of Technology Bombay
Cadence wins four 2023 TSMC OIP Partner of the Year Awards
Samsung Electronics unveils automotive process strategy
HKSTP and J2 Semiconductor sign MOU
Renesas reveals new organisational structure
Cadence joins Arm Total Design
Socionext begins development of SoCs for Advanced ADAS and AD
×
Search the news archive

To close this popup you can press escape or click the close icon.
Logo
×
Logo
×
Register - Step 1

You may choose to subscribe to the Silicon Semiconductor Magazine, the Silicon Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: