Nearfield Instruments to supply QUADRA Metrology System to Asian fab
Nearfield Instruments has received a purchase order for its QUADRA® metrology systems from a major semiconductor manufacturing fab in Asia.
QUADRA is the semiconductor industry's highest-throughput atomic force microscopy (AFM) metrology system designed for in-line, on-device, non-destructive three-dimensional (3D) metrology. This system is essential for accelerating time to yield and optimizing high-volume manufacturing (HVM) yield for advanced semiconductor fabs.
The purchase order also includes Nearfield's recently launched Lightning Mode™, a new feature for QUADRA that significantly boosts productivity and throughput, and Nearfield's proprietary imaging algorithm and data analysis software to assist customers address the process challenges posed by shrinking geometries, complex 3D structuring, and advanced packaging for High Bandwidth Memory (HBM).
"We are delighted to receive this order from a world-leading advanced fab in Asia, which continues to ramp aggressively to meet the growing demand for advanced devices such as HBM that enable AI applications," said Hamed Sadeghian, CEO of Nearfield Instruments. "We are proud that our process control solutions address the challenging requirements of semiconductor manufacturing of advanced devices as well as of future angstrom-level nodes. With our fast time-to-solution and non-destructive systems we are committed to contribute to greener semiconductor fabs."
