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Friday 1st July 2005
The relentless reduction in the size of chip features is imposing ever-growing demands on metrology.
Friday 1st July 2005
A new type of transistor featuring dual gates could help the semiconductor industry ensure that Moore's Law continues to remain true.
Friday 1st July 2005
It is becoming increasingly important for metrology to analyse chips in more than two dimensions. Nick Dawes, Todd Henry and Doug Hahn of FEI Company report on a technology that brings the third dimension to bear.
Friday 1st July 2005
Care needs to be taken when choosing X-ray inspection tools else you might not end up with quite what you expected. Dr Mike Cooke reports.
Friday 1st July 2005
A supplier's perspective: lessons learned from the big low-k bust
Friday 1st July 2005
Even the slightest vibrations can damage silicon wafers, especially at the latest technology nodes. That's why vibration management is becoming an increasingly important issue for fab managers. Reactec commercial director Tim Kent reports.
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Wednesday 1st June 2005
3D system-on-chips could provide semiconductor makers with an easy method of combining the benefits of both system-in-package and system-on-chip, writes Ziptronix vice president Bill Knapp.
Wednesday 1st June 2005
The success of the world's leading lithography company is based on close collaboration with its suppliers. David Ridsdale reports on how ASML and Carl Zeiss SMT have transformed lithography.
Wednesday 1st June 2005
HF appears to be one of the best chemicals for selectively wet etching favoured high-k material HfO2 but, according to recent research, it must be acidified and heated to work correctly. Kurt Christenson of FSI International explains.
Wednesday 1st June 2005
Single wafer processing offers several advantages over the batch approach, especially in the field of wafer wet processing. SEZ Group vice president of corporate planning Heinz Oyrer reports.
Sunday 1st May 2005
"Pursuing the global digital utopia" was the theme of a recent conference in Malta. David Ridsdale reports.
Sunday 1st May 2005
Eurosemi editor-in-chief David Ridsdale shares his views on the Semicon Europa trade exhibition held in Munich last month.
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Sunday 1st May 2005
The consumer and automobile markets will be key growth sectors for the semiconductor industry, according to speakers at the recent Semico Summitt in Arizona.
Sunday 1st May 2005
One of the biggest challenges at the 90nm node is power dissipation, which causes chips to heat up and drains batteries. World number one foundry TSMC believes that electronic design automation will play a key role in overcoming this tricky problem.
Sunday 1st May 2005
Progress in miniaturising electronic components for portable devices such as mobile phones and MP3 players is being boosted by the development of ultra-thin packaging techniques. Luu Nguyen and Sadanand Patil of National Semiconductor report.
Sunday 1st May 2005
Whenever a piece of equipment fails in a fab – or has to be taken out of service for maintenance – the costs can be enormous in terms of lost production. David Holt of Perlast reports on a new seal that promises to improve the reliability of a vital component of many deposition tools.
Sunday 1st May 2005
Metrology is becoming an ever more challenging area as a result of smaller feature sizes, copper interconnects and new fragile low-k materials that are susceptible to damage during measuring. Philips AMS take a look at how these challenges are being met.
Sunday 1st May 2005
Lab-on-chips could become a major growth area for the semiconductor industry but in the past no-one has been prepared to risk the cash needed for volume production. Alec Reader of Innos believes it is now time for that risk to be taken.
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Friday 1st April 2005
Dutch research team's breakthrough in non-volatile plastic memory could pave the way for innovative new radio frequency tag applications.
Friday 1st April 2005
The European commission has issued a revision to the electromagnetic compatibility (EMC) directive – which aims to prevent radio interference from electronic products. The commission claims the revision simplifies regulatory procedures, reduces manufacturers' costs and increases product information and documentation available to inspectors.
Friday 1st April 2005
European Semiconductor Magazine presents a two-part feature on the 50 most influential people in the semiconductor industry.
Friday 1st April 2005
The industry's never-ending quest to scale down is throwing up some tough challenges for metrology. Neal Sullivan and Paul Knutrud of Solurus explain how one metrology method is measuring up to sub-100nm processes.
Friday 1st April 2005
With ever more patent disputes going to court, it has never been more important for companies to build up strong evidence to back up their patent claims. Reverse engineering is one of the most effective ways of achieving this, writes Chipworks patent advisor Andrea Girones.
Friday 1st April 2005
Extensive research has been carried out to determine the impact of different slurries on post chemical mechanical planarisation topography and electrical performance. Dr Zvezdalina Stavreva and Dr Goetz Springer of Infineon and Roger Tushingham, Jim Schlueter and Sanjay Basak of Novellus Systems present the results of this research.
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