Aehr Test Systems wins $2.5 million order from major IC manufacturer
California based Aehr Test Systems has received over $2.5 million in production orders for its semiconductor burn-in and test systems from a leading manufacturer of advanced logic integrated circuits (ICs).
The systems will be used for automotive, embedded processing, digital signal processing and analogue applications.
The orders include down payments to lock in delivery slots and volume pricing discounts and are for multiple Advanced Burn-in and Test Systems (ABTS) and a follow-on MAX system.
The ABTS systems feature a new low-cost high-volume configuration targeted at production test and burn-in of lower-power devices.
This new ABTS offers the option of high voltage Device Power Supplies configurable with 60V, 80V, 150V or 230V programmable voltage ranges, which are needed for automotive and power-line applications. Shipments of this new ABTS configuration are expected to begin in the fourth quarter of calendar year 2013.
"We are pleased to receive these orders for production test and burn-in systems. The new ABTS system configuration offers over 50 percent more device test capacity than our previous MAX family of production test and burn-in systems," says Carl Buck, vice president of marketing at Aehr Test Systems. "Importantly, this new ABTS is designed to allow the customer to continue to use their extensive inventory of MAX-style burn-in boards on the ABTS while also offering the increased capacity for new devices. This ABTS configuration extends the capabilities of our MAX systems by providing an increase to 128 I/O channels and 8 unique device power supplies per burn-in board, in addition to the new high-voltage supplies," he adds.
"The new configuration extends our already successful ABTS-Pi system, which features Individual Temperature Control of each device for high power applications, to provide a lower cost and higher parallel solution for automotive, standard logic and high voltage applications," Buck concludes.
The ABTS family of products is based on a new hardware and software platform that is designed to address not only today's devices, but also future devices for many years to come. It can test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications.
The ABTS system can be configured with up to 72 burn-in boards with up to 320 I/O channels each and 32 million of test vector memory per channel. The system is optimised for use with the Sensata iSocket Thermal Management Technology, which provides a scalable cost-effective solution using individual device temperature control for ICs up to 75 watts or more.
Individual temperature control enables high-power devices with a broad range of power dissipation to be burned-in simultaneously in a single burn-in chamber while maintaining a precise device temperature. The ABTS system also uses N+1 redundancy technology for many key components in the system to maximise system uptime.
Headquartered in Fremont, California, Aehr Test Systems is a global provider of test systems for burning-in and testing logic and memory integrated circuits and has an installed base of more than 2,500 systems worldwide.
