Particle Measuring Systems release sensitive liquid optical particle counter
Particle Measuring Systems has announced the release of Ultra DI-20, its latest product for ultra-pure water quality assurance in Semiconductor and related industries. Leveraging their success with the industry leading Ultra DI-50 product, Particle Measuring Systems newest product provides 20nm sensitivity on polymer and <10nm sensitivity on metallic nanoparticle contaminants. This advancement provides real-time visibility to yield impacting nanoparticles at sizes not previously detectable in fluids.
"The Ultra DI-20 nanoparticle counter meets leading edge 300mm and planned 450mm sensitivity requirements in a reliable and repeatable system. Ultra DI-20 correlates well with pre-existing metrology solutions while providing visibility to nanoparticles not previously detectable in real-time. Ultra DI-20 quantifies the very low particle concentration levels encountered in advanced Semiconductor manufacturing. Offering data in multiple channels, Ultra DI-20 characterizes particle size distribution and provides a correlation path from legacy instrumentation into the future" said Brian Knollenberg, VP/GM of the Electronics Division at Particle Measuring Systems.
