Broadcom Selects Teseda's Diagnostic Test System
Teseda Corporation has announced that Broadcom Corporation, a global innovation leader in semiconductor solutions for wired and wireless communications, has purchased the Teseda Diagnostic Test System for design debug, test pattern debug, scan debug and device validation.
Teseda's Diagnostic Test System is a core design analysis and product engineering tool used for first silicon bring-up and general product engineering that has provided Broadcom with a complete bench-top device stimulus and test system to achieve working silicon and enhanced semiconductor device performance.
"Teseda's Diagnostic Test System provides the reliability and proven performance we need to quickly test first silicon, conduct design debug and validate test patterns," said Mo Aslam, Principal Test Engineer at Broadcom Corporation. "The small form factor and low price point allows the system to be used anywhere, including a desk top environment, resulting in added flexibility for our global engineering team."
"We are delighted with Broadcom UK's decision to upgrade to our latest product, the Diagnostic Test System" said Armagan Akar, Chief Executive Officer at Teseda Corporation. "Teseda continues to provide scalable and upwardly compatible products meeting customers' evolving needs."
The Teseda Diagnostic Test System provides a desk top platform environment for Design-For-Test scan architecture validation. Establishing the structural integrity of a new device is essential for the design and scan debug in 1st silicon. The features in the system, to be used by DFT and Product engineers, further includes the capabilities for test pattern validation and debug for production test.
