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Industry News


Monday 13th May 2019
EPC's chief executive, Alex Lidow, believes his GaN devices now beat silicon on performance and price, reports Rebecca Pool.
Wednesday 24th April 2019
As foreign governments take big steps to advance their domestic semiconductor capabilities, new blueprint lays out research, workforce, trade initiatives needed to help keep America on top in chip technology
Thursday 14th March 2019
Provides significant cost savings for ultra-harsh semiconductor processing
Tuesday 12th March 2019
Imec has developed a new, non-destructive method for measuring electromigration – one of the main reliability problems in chips. The new measuring method discovers and helps understand electromigration in chips much more quickly (and without destroying them) than the standard method.