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Industry News

Monday 11th February 2019
Atlas Copco’s Industrial Vacuum division have launched the DHS 065-200 VSD+ dry screw vacuum pump offering lower lifecycle costs, higher productivity, less energy consumption and easy maintenance.
Tuesday 29th January 2019
Thomas Brand from Analog Devices explains the demands on sensors for future servicing
Tuesday 29th January 2019
Artificial intelligence (AI) is presently revolutionizing many diverse aspects of our society. For example, by combining the advancements in data mining and deep learning, it is now feasible to utilize AI to analyze large chunks of data from various sources, to identify patterns, provide interactive insights and make intelligent predictions. Kaustubh Gandhi, Product Manager Software, Bosch Sensortec discusses.
Tuesday 29th January 2019
With the growth of new applications, there is a rapidly increasing demand for new and more sophisticated sensors. Nicolas Sauvage, Sr. Director Ecosystem at InvenSense explains why.
Monday 28th January 2019
The Internet of Things (IoT) is now already reality in multiple application areas. Smart sensors used in smart cities, autonomous driving, home and building automation (HABA), industrial applications, etc. experience challenging requirements in large interconnected networks. A significant increase of data transmission and required bandwidth, leading to an overload of the communication infrastructure can be expected. To mitigate this, the use of artificial intelligence (AI) in smart sensors can significantly reduce the amount of data exchange within the networks. Philipp Jantscher from ams AG explains.
Thursday 24th January 2019
The new ERS MPDM700 supports the increasing demand for fast prototyping and New Product Introduction of advanced packaging in large panel format; it offers ERS´s complete range of thermal debonding capabilities and even more powerful warpage adjustment.
Wednesday 23rd January 2019
Novel approaches to vacuum and abatement challenges help to enable new, more complex chip technologies and more productive fabs
Tuesday 22nd January 2019
Advanced X-ray topography tool offers more insights into semiconductor substrate and epilayer characterisation