FIB-SEM promises more samples per hour

Trevan Landin, Senior Manager Semiconductor Yield Learning Products, Thermo Fisher Scientific, discusses the recently launched Thermo Scientific Helios 6 HD Focused Ion Beam Scanning Electron Microscope (FIB-SEM) designed to produce a high volume of quality transmission electron microscopy (TEM) data to support semiconductor manufacturers’ imaging and failure analysis needs during device design and fabrication.

This video is part of a collection: SiS Issue 2 - Part 1