VIDEO
A force to be reckoned with in nano-metrology
Video Summary
Sang-Joon Cho, Executive Vice President of Sales at Park Systems, explains some of the company’s recent Atomic Force Microscope (AFM) developments, the thinking behind the recent Accurion acquisition and shares his optimism as to the future of the semiconductor industry and the role that AFM technology has to play in helping customers overcome current optical metrology limitations.
