VIDEO
Seeing the unseen
Video Summary
Mark Najarian, Product Marketing Manager Fab Solutions at Thermo Fisher Scientific, explains how, to deliver lab quality data and insights without leaving the fab, the company has introduced the Thermo Scientific™ Helios™ MX1 PFIB Scanning Electron Microscope (SEM), which uses automated 3D metrology to significantly enhance the analysis of semiconductor logic, memory and advanced packaging devices. Designed to increase productivity in the fab, this fully automated wafer analysis system accelerates time-to-yield by providing fast, accurate and valuable insights into semiconductor subsurface defects.
