VIDEO
Making waves in metrology innovation
Video Summary
Javier Elizalde Co-Founder and Chief Operating Officer (COO) of Wooptix, discusses the launch of the company’s Phemet® metrology system that provides ultra-fast and extremely accurate wafer shape and geometry measurements with sub-nanometer resolution. Javier explains that he Phemet® system’s ability to capture more than 16 million data points with sub-nanometer resolution with ultra speed in a single pass sets a new metrology benchmark for the industry. The system is especially useful for high-throughput in-line measurements of hybrid bonding, back-side power delivery logic architectures, and next-generation 3D NAND and HBM.
