VIDEO
Eliminating the Guesswork in FIB Milling
Video Summary
Dr. Thomas Rodgers, Senior Director of Market Strategy, Head of Business Sector Electronics, ZEISS Microscopy, discusses the launch of the company’s ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimised for demanding sample preparation. It provides a live, high-resolution “see while you mill” view at any imaging and milling condition to enable immediate feedback and eliminate milling interruptions for uniform first-pass transmission electron microscopy (TEM) lamellae and precise FIB cross sections.
